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Texas Instruments STATISTICS Solid State Software Cartridge (Prototype)

Date of introduction:  (1983) Display technology:  
New price:  $59.95 (MSRP 1983) Display size:  
Size:  1.8" x 2.0" x 0.50"
 46 x 52 x 13 mm3
   
Weight:  0.9 ounces, 26 grams Serial No:  
Batteries:  n.a. Date of manufacture:  wk 49 year 1982
AC-Adapter:   Origin of manufacture:  USA
Precision:   Integrated circuits:  HN61256P
Memories:      
Program steps:   Courtesy of:  Brian Green

The STATISTICS Solid State Software Cartridge (SSSC) was developed by Texas Instruments for its CC-40 Compact Computer System and contains 14 easy-to-use programs chosen to serve a broad range of statistical applications:

• Descriptive Statistics - Histogram
• Descriptive Statistics - Means and Moments
• Parametric Tests - T-Test Paired Observations
• Parametric Tests - T-Test Unpaired Observations
• Non-Parametric Tests - Contingency Table Analysis
• Non-Parametric Tests - Mann-Whitney Rank-Sum Test
• Analysis of Variance - One-Way ANOVA
• Analysis of Variance - Two-Way ANOVA
• Theoretical Distributions - Binominal Distribution
• Theoretical Distributions - Chi-Square Distribution
• Theoretical Distributions - F-Distribution
• Theoretical Distributions - Normal Distribution
• Theoretical Distributions - Poisson Distribution
• Theoretical Distributions - Student's T-Distribution

This early prototype of the STATISTICS SSSC uses a different form factor and electrical connector than the final SS-3008 STATISTICS SSSC and fits only with the never released prototypes of the Compact Computer 40.

Dismantling this Solid State Software Cartridge manufactured in March 1984 by Texas Instruments in their Lubbock, Texas facility, reveals a small printed circuit board (PCB) with a HN61256P ROM (Read-Only Memory) manufactured by Hitachi, Japan.

The HN61256P uses a CMOS process resulting in a very low power consumption of 7.5 mW and features a capacity of 32k Bytes with an access time of 3.5 us.



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© Joerg Woerner, December 27, 2020. No reprints without written permission.